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Atomic-scale Etching and Deposition using adsorbed Halogen gases on Semiconductor surfaces.

Atomic-scale Etching and Deposition using adsorbed Halogen gases on Semiconductor surfaces.
使用半导体表面吸附的卤素气体进行原子级蚀刻和沉积。
批准号:
06452121
负责人:
YOSHIMURA Masamichi
金额:
$4.74万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
1994
资助国家:
日本
项目状态:
已结题
起止时间:
1994 至 1996

项目摘要

项目成果

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中文摘要
翻译
随着器件规模的缩小,最终有必要在原子水平上了解表面反应,如蚀刻和沉积过程。本研究项目旨在利用扫描隧道显微镜(STM),在考虑反应物种的化学性质的情况下,阐明此类表面反应。取得了以下研究成果:1.阐明了Si(001)表面的电子结构。由于再成键的性质,S_B型台阶带正电荷。AlCl3和BCl3分子立即在硅表面分解,提供硅吸附原子上的氯原子。研究发现,在热处理过程中,氯原子从表面解吸,金属沉积并在表面形成超结构。在扫描隧道显微镜针尖和样品表面之间施加电压脉冲来操纵吸附在硅原子上的氯原子。通过积累数据,提出了一种可能的刻蚀机理,并与理论结果进行了比较。其机理包括近场效应修正的场蒸发。同时考虑了电子注入效应。还实现了对吸附的未破裂分子的操纵。脉冲引起分子的解离、置换和脱附。利用NH3气体分子成功地在硅表面沉积了N原子。结果形成了一层完美的SiN薄膜。硅层的刻蚀是在原子氢的帮助下完成的。提出了刻蚀机理。
英文摘要
With the down-scaling of devices, it would be ultimately necessary to understand surface reactions at an atomic level, such as etching and deposition processes. The present research project aims to clarify such surface reactions, taking into consideration the chemical properties of the reaction species, by use of scanning tunneling microscopy (STM). The following research results have been obtained.1. The electronic structures of the Si (001) surface have been clarified. The S_B-type step is positively charged due to the rebonding nature.2. Both AlCl_3 and BCl_3 molecules immediately break down on the silicon surface, supplying the Cl atoms on the Si adatoms. It is found that, upon annealing, Cl atoms desorb from the surface and the metal is deposited and formed a supestructure on the surface.3. The Cl atom adsorbed on the Si adatom was manipulated by voltage pulses applied between the STM tip and the sample surface. By accumulating data, a possible etching mechanism was proposed in comparison with the theoretical results. The mechanism includes field evaporation modified by near-field effect. Electron injection effect is also considered.4. Manipulation of adsorbed non-broken molecules is also realized. The pulse causes the dissociation, displacement and desorption of molecules.5. The deposition of N atoms on the silicon surface was successfully achieved using NH_3 gas molecules. As a result, a perfect SiN thin film was formed.6. The etching of the Si layr was accomplished by help of atomic hydrogen. The etching mechanism was proposed.
期刊论文(62)
专著(0)
科研奖励(0)
会议论文
M.Yoshimura: "STM Study of the Interfacial Structure of Nickel Silicides" J.Vac.Sci.Technol.B14. 1245-1246 (1995)
M.Yoshimura:“硅化镍界面结构的 STM 研究”J.Vac.Sci.Technol.B14。
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通讯作者:
T.Yao: "Atomistic Study on Solid Phase Epitaxy Processes on Si (100) Surface by the Scanning Tunneling Microscope" J.Crystal. Growth. 163. 78-85 (1996)
T.Yao:“利用扫描隧道显微镜对 Si(100) 表面固相外延过程进行原子研究”J.Crystal。
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通讯作者:
T.Yao, S.Shinabe and M.Yoshimura: "Atomistic Study of the Formation Process of Ni Silicide on the Si (111)-7*7 Surface with Scanning Tnneling Microscopy" Applied Surface science. 104/105. 213-217 (1996)
T.Yao、S.Shinabe 和 M.Yoshimura:“利用扫描隧道显微镜对 Si (111)-7*7 表面上镍硅化物的形成过程进行原子研究”应用表面科学。
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通讯作者:
K.Uesugi, T.Komura, M.Yoshimura, and T.Yao: "Solid-phase Epitaxy Processes of Amorphous Silicon Layrs Formed on Silicon (001) Substrates Observed with Scanning Tunneling Microscopy" Proc.of 22nd lnt'l.Conf.on the Physics of Semiconductors. 640-643 (1995)
K.Uesugi、T.Komura、M.Yoshimura 和 T.Yao:“用扫描隧道显微镜观察到在硅 (001) 衬底上形成的非晶硅层的固相外延过程”Proc.of 22nd lntl.Conf。
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