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Ultra-Thin Silicon Wafer Bonding

Ultra-Thin Silicon Wafer Bonding
超薄硅片键合
批准号:
9529616
负责人:
Kenneth Farmer
金额:
$3.5万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1995
资助国家:
美国
项目状态:
已结题
起止时间:
1995-10-01 至 1996-09-30

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中文摘要
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英文摘要
9529616 Farmer This proposal describes research and the need for specialized equipment in the area of bonding ultra-thin silicon wafers (as thin as 2 micrometers) to virgin and oxidized silicon substrates. The integrity of the bonded interface is of paramount importance in understanding the fundamental issues of reliability and failure mechanisms. The quality of the interface will be examined with an IR microscope to determine the effects of annealing temperature and surface roughness. The fields of application for this technology include Micro-Electro-Mechanical Systems (MEMS), Silicon on Insulator (SOI) and Silicon (SOS). ***
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Acquisition of Instrumentation for Deep Reactive Ion Etching of Ultra-Thin Bonded Wafers
  • 批准号:
    9871272
  • 项目类别:
    Standard Grant
  • 资助金额:
    $46.74万
  • 财政年份:
    1998
  • 负责人:
    Kenneth Farmer
  • 依托单位:
Acquisition of Instrumentation for Research and Development of Bonded Ultra Thin Silicon Wafers
  • 批准号:
    9601937
  • 项目类别:
    Standard Grant
  • 资助金额:
    $20.26万
  • 财政年份:
    1996
  • 负责人:
    Kenneth Farmer
  • 依托单位:
CAREER: Ultra-Thin Oxides on Silicon and Thin Silicon Wafer Bonding
  • 批准号:
    9624798
  • 项目类别:
    Standard Grant
  • 资助金额:
    $25.0万
  • 财政年份:
    1996
  • 负责人:
    Kenneth Farmer
  • 依托单位:
Tunneling Measurements for Electro-Structural Analysis of Ultra-thin Dielectrics on Silicon
  • 批准号:
    9313937
  • 项目类别:
    Continuing grant
  • 资助金额:
    $0.0万
  • 财政年份:
    1993
  • 负责人:
    Kenneth Farmer
  • 依托单位:
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