Acquisition of XPS Instrumentation for a Departmental Materials Characterization Facility

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This award from the Chemistry Research Instrumentation and Facilities (CRIF) Program and the Major Research Instrumentation (MRI) Program will assist the Department of Chemistry at Colorado State University acquire XPS instrumentation for a departmental materials characterization facility. This equipment will enhance research in a number of areas including the following: (1) vapor deposition processes for synthesis and modification of electronic, novel polymeric, and nanostructured materials; (2) solid state and materials chemistry with an emphasis on zintl ion chemistry and heavy element environmental chemistry; (3) polymer and organic ultrathin films; (4) chemical vapor deposition of electronic materials; (5) materials and surface chemistry as applied to organic semiconductor interfaces, preparation of organic light emitting diodes, and dye sensitization of wide gap inorganic semiconductors; and (6) thin film chemical vapor deposition. The X-ray photoelectron (XPS) spectrometer is used for chemical analysis. It irradiates a sample with a beam of monochromatic X-rays and the energies of the resulting photoelectrons are measured and are related to specific elements.