Acquisition of XPS Instrumentation for a Departmental Materials Characterization Facility

化学研究仪器和设施(CRIF)计划和主要研究仪器(MRI)计划颁发的这一奖项将帮助科罗拉多州立大学化学系为系材料表征设施获得XPS仪器。该设备将加强以下领域的研究：(1)气相沉积工艺，用于电子、新型聚合物和纳米结构材料的合成和改性；(2)固态和材料化学，重点是锌离子化学和重元素环境化学；(3)聚合物和有机超薄膜；(4)电子材料的化学气相沉积；(5)用于有机半导体界面的材料和表面化学，有机发光二极管的制备，以及宽禁带无机半导体的染料敏化；以及(6)薄膜化学气相沉积。X射线光电子能谱(XPS)用于化学分析。它用一束单色X射线照射样品，产生的光电子的能量被测量，并与特定的元素有关。

This award from the Chemistry Research Instrumentation and Facilities (CRIF) Program and the Major Research Instrumentation (MRI) Program will assist the Department of Chemistry at Colorado State University acquire XPS instrumentation for a departmental materials characterization facility. This equipment will enhance research in a number of areas including the following: (1) vapor deposition processes for synthesis and modification of electronic, novel polymeric, and nanostructured materials; (2) solid state and materials chemistry with an emphasis on zintl ion chemistry and heavy element environmental chemistry; (3) polymer and organic ultrathin films; (4) chemical vapor deposition of electronic materials; (5) materials and surface chemistry as applied to organic semiconductor interfaces, preparation of organic light emitting diodes, and dye sensitization of wide gap inorganic semiconductors; and (6) thin film chemical vapor deposition. The X-ray photoelectron (XPS) spectrometer is used for chemical analysis. It irradiates a sample with a beam of monochromatic X-rays and the energies of the resulting photoelectrons are measured and are related to specific elements.