Acquisition of an Integrated Scanning Electron Microscope System

购置集成扫描电子显微镜系统

基本信息

  • 批准号:
    0114093
  • 负责人:
  • 金额:
    $ 30万
  • 依托单位:
  • 依托单位国家:
    美国
  • 项目类别:
    Standard Grant
  • 财政年份:
    2001
  • 资助国家:
    美国
  • 起止时间:
    2001-09-01 至 2003-08-31
  • 项目状态:
    已结题

项目摘要

This award from the Instrumentation for Materials Research program and the Major Research Instrumentation program to Colorado state University will fund the purchase of an integrated field emission scanning electron microscope (FE-SEM) system for the central Electron Microscopy Center at Colorado State University. The equipment requested will allow imaging specimens at high resolution, providing resolution of structures as small as 1.5 nanometers. An energy dispersive spectroscopy (EDS) system will allow chemical identification, with the capability of precisely mapping multiple elements over a wide area. A third component of the instrumentation will enable investigators to produce nanoscale devices using electron beam lithography. This technique, in conjunction with the high resolution FE-SEM will allow generation of structures as small as 10 nm for applications in optoelectronic materials, superconductors, and sensors. The instrumentation will support the research efforts of seven primary investigators from five departments across campus. In addition, it will be useed by research groups in 8 other departments at CSU as well as several other investigators (both academic and industrial) from along the Colorado Front Range. Finally, the FE-SEM will be used to support and extend the teaching mission of the EM center and the University through hands-on instruction and telepresence microscopy.This award from the Instrumentation for Material Research program and the Major Research Instrumentation program to Colorado State University will fund the purchase of an integrated system of imaging and analytical tools that will greatly expand the capabilities of the Electron Microscopy (EM) Center at Colorado State University. The state-of-the-art scanning electron microscope (SEM) will allow imaging of both biological and materials specimens at the highest magnifications currently possible. In addition, an x-ray analyzer attached to the microscope will provide identification of most elements in the periodic table and will map their locations with high precision on specimen surfaces. The electron beam lithography system, coupled with the SEM will allow production of micro- and nanoscopic structures that will be used in a variety of optical and electrical devices, such as light emitting diodes, semiconductor lasers, and highly efficient sensors and detectors. The educational mission of science and engineering departments across the CSU campus will also be enhanced by the acquisition of this instrumentation through hands-on instruction and remote access via telepresence microscopy.
材料研究仪器计划和主要研究仪器计划授予科罗拉多州立大学的这一奖项将为科罗拉多州立大学的中央电子显微镜中心购买集成场发射扫描电子显微镜(FE-SEM)系统提供资金。 所要求的设备将允许以高分辨率对样品进行成像,提供小至1.5纳米的结构分辨率。 能量色散光谱(EDS)系统将允许化学识别,具有在广泛区域内精确映射多种元素的能力。 仪器的第三个组成部分将使研究人员能够使用电子束光刻法生产纳米级器件。 该技术与高分辨率FE-SEM相结合,将允许生成小至10 nm的结构,用于光电材料,超导体和传感器。 该仪器将支持来自校园五个部门的七名主要研究人员的研究工作。 此外,它还将被科罗拉多州立大学其他8个部门的研究小组以及科罗拉多前线山脉沿着其他几个调查人员(学术和工业)使用。 最后,FE-SEM将用于支持和扩展EM中心和大学的教学使命,通过实践教学和远程呈现显微镜。材料研究仪器计划和主要研究仪器计划授予科罗拉多州立大学的这一奖项将资助购买成像和分析工具的集成系统,该系统将大大扩展电子显微镜的能力(EM)中心在科罗拉多州立大学。 最先进的扫描电子显微镜(SEM)将允许在目前可能的最高放大倍数下对生物和材料样本进行成像。 此外,连接到显微镜的X射线分析仪将提供周期表中大多数元素的识别,并将在样品表面上以高精度绘制它们的位置。 电子束光刻系统与SEM相结合,将允许生产微米和纳米级结构,这些结构将用于各种光学和电气设备,例如发光二极管,半导体激光器和高效传感器和检测器。 整个CSU校园的科学和工程部门的教育使命也将通过通过实践教学和远程访问通过远程呈现显微镜获得这种仪器来加强。

项目成果

期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)

数据更新时间:{{ journalArticles.updateTime }}

{{ item.title }}
{{ item.translation_title }}
  • DOI:
    {{ item.doi }}
  • 发表时间:
    {{ item.publish_year }}
  • 期刊:
  • 影响因子:
    {{ item.factor }}
  • 作者:
    {{ item.authors }}
  • 通讯作者:
    {{ item.author }}

数据更新时间:{{ journalArticles.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ monograph.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ sciAawards.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ conferencePapers.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ patent.updateTime }}

Ellen Fisher其他文献

The Hopkins Symptom Checklist. Assessing emotional distress in obstetric-gynecologic practice.
霍普金斯症状清单。
  • DOI:
  • 发表时间:
    1976
  • 期刊:
  • 影响因子:
    1.9
  • 作者:
    Karl Rickels;Celso;Ronald S. Lipman;Derogatis Lr;Ellen Fisher
  • 通讯作者:
    Ellen Fisher

Ellen Fisher的其他文献

{{ item.title }}
{{ item.translation_title }}
  • DOI:
    {{ item.doi }}
  • 发表时间:
    {{ item.publish_year }}
  • 期刊:
  • 影响因子:
    {{ item.factor }}
  • 作者:
    {{ item.authors }}
  • 通讯作者:
    {{ item.author }}

{{ truncateString('Ellen Fisher', 18)}}的其他基金

Unraveling Plasma-Assisted Catalysis: Toward Understanding Fundamental Molecule-Surface Interactions and Energy Partitioning Synergisms
揭示等离子体辅助催化:理解基本的分子-表面相互作用和能量分配协同作用
  • 批准号:
    1803067
  • 财政年份:
    2018
  • 资助金额:
    $ 30万
  • 项目类别:
    Standard Grant
Systematic Studies of the Dynamics, Energetics, and Surface Interactions of Plasma Species during Materials Processing
材料加工过程中等离子体物质的动力学、能量学和表面相互作用的系统研究
  • 批准号:
    1152963
  • 财政年份:
    2012
  • 资助金额:
    $ 30万
  • 项目类别:
    Standard Grant
Toward Fundamental Understanding of Plasma Processing Mechanisms: In Situ Studies of the Gas-Surface Interface During Materials Deposition and Modification
对等离子体处理机制的基本理解:材料沉积和改性过程中气体-表面界面的原位研究
  • 批准号:
    0911248
  • 财政年份:
    2009
  • 资助金额:
    $ 30万
  • 项目类别:
    Continuing Grant
REU Site: Materials Chemistry Research: Synthesis, Characterization, and Device Fabrication
REU 网站:材料化学研究:合成、表征和器件制造
  • 批准号:
    0649263
  • 财政年份:
    2007
  • 资助金额:
    $ 30万
  • 项目类别:
    Continuing Grant
Toward Fundamental Understanding: Correlating the Gas-Phase, Surface, and Gas-Surface Interface in Halogenated Plasma Systems
迈向基本理解:关联卤化等离子体系统中的气相、表面和气体-表面界面
  • 批准号:
    0613653
  • 财政年份:
    2006
  • 资助金额:
    $ 30万
  • 项目类别:
    Continuing Grant
Mechanistic Studies of Plasma Deposition and Etching for Integrated Circuit Materials
集成电路材料等离子沉积与刻蚀机理研究
  • 批准号:
    0137664
  • 财政年份:
    2002
  • 资助金额:
    $ 30万
  • 项目类别:
    Continuing Grant
Acquisition of XPS Instrumentation for a Departmental Materials Characterization Facility
为部门材料表征设施购置 XPS 仪器
  • 批准号:
    9977398
  • 财政年份:
    1999
  • 资助金额:
    $ 30万
  • 项目类别:
    Standard Grant
POWRE: Resonantly Enhanced Multiphoton Ionization for Measurement of Radical-Surface Reactivities
POWRE:用于测量自由基表面反应性的共振增强多光子电离
  • 批准号:
    9805815
  • 财政年份:
    1998
  • 资助金额:
    $ 30万
  • 项目类别:
    Standard Grant
Investigation of Plasma Deposition and Etching Mechanisms for Silicon-based Materials
硅基材料的等离子体沉积和刻蚀机理研究
  • 批准号:
    9812332
  • 财政年份:
    1998
  • 资助金额:
    $ 30万
  • 项目类别:
    Continuing Grant
Investigation of Plasma Deposition Mechanisms for Silicon Dioxide and Silicon Nitride Films
二氧化硅和氮化硅薄膜的等离子体沉积机理研究
  • 批准号:
    9501157
  • 财政年份:
    1995
  • 资助金额:
    $ 30万
  • 项目类别:
    Continuing Grant

相似国自然基金

greenwashing behavior in China:Basedon an integrated view of reconfiguration of environmental authority and decoupling logic
  • 批准号:
  • 批准年份:
    2024
  • 资助金额:
    万元
  • 项目类别:
    外国学者研究基金项目
焦虑症小鼠模型整合模式(Integrated) 行为和精细行为评价体系的构建
  • 批准号:
  • 批准年份:
    2024
  • 资助金额:
    0.0 万元
  • 项目类别:
    省市级项目

相似海外基金

Integrated ultramicrotome for serial block face scanning electron microscopy (SBF-SEM)
用于串行块面扫描电子显微镜 (SBF-SEM) 的集成超薄切片机
  • 批准号:
    500508043
  • 财政年份:
    2022
  • 资助金额:
    $ 30万
  • 项目类别:
    Major Research Instrumentation
Non-contact scanning probe station for advanced wafer scale testing of photonic integrated circuits
用于光子集成电路先进晶圆级测试的非接触式扫描探针台
  • 批准号:
    EP/W024683/1
  • 财政年份:
    2022
  • 资助金额:
    $ 30万
  • 项目类别:
    Research Grant
Integrated data-driven analysis of materials properties by nano-electron probe scanning real/reciprocal space
通过纳米电子探针扫描实/倒易空间对材料特性进行集成数据驱动分析
  • 批准号:
    21H04616
  • 财政年份:
    2021
  • 资助金额:
    $ 30万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
MRI: Acquisition of a Variable Pressure Scanning Electron Microscope with integrated EBSD, EDS, and CL
MRI:获取集成 EBSD、EDS 和 CL 的变压扫描电子显微镜
  • 批准号:
    2018776
  • 财政年份:
    2020
  • 资助金额:
    $ 30万
  • 项目类别:
    Standard Grant
Acquisition of a scanning electron microscope with integrated EDS for enhancement of multi-disciplinary undergraduate research and research training
购置一台集成 EDS 的扫描电子显微镜,以加强多学科本科生研究和研究培训
  • 批准号:
    1919569
  • 财政年份:
    2019
  • 资助金额:
    $ 30万
  • 项目类别:
    Standard Grant
MRI: Acquisition of integrated laser scanning/spinning disk confocal microscopy system to advance multidisciplinary research and training at Mount Holyoke College
MRI:采购集成激光扫描/旋转盘共焦显微镜系统,以推进曼荷莲学院的多学科研究和培训
  • 批准号:
    1827945
  • 财政年份:
    2018
  • 资助金额:
    $ 30万
  • 项目类别:
    Standard Grant
SBIR Phase II: Integrated Nano-Electro-Mechanical Scanning Probes for Failure Analysis of the 10-Nanometer Node and Beyond
SBIR 第二阶段:用于 10 纳米及以上节点故障分析的集成纳米机电扫描探针
  • 批准号:
    1632534
  • 财政年份:
    2016
  • 资助金额:
    $ 30万
  • 项目类别:
    Standard Grant
Integrated Plasma Source Focused Ion Beam with Scanning Electron Microscope
集成等离子源聚焦离子束与扫描电子显微镜
  • 批准号:
    EP/P001521/1
  • 财政年份:
    2016
  • 资助金额:
    $ 30万
  • 项目类别:
    Research Grant
MRI: Acquisition of a Scanning Electron Microscope with integrated EDS, WDS, and EBSD for research and undergraduate research training
MRI:购买集成 EDS、WDS 和 EBSD 的扫描电子显微镜,用于研究和本科生研究培训
  • 批准号:
    1626271
  • 财政年份:
    2016
  • 资助金额:
    $ 30万
  • 项目类别:
    Standard Grant
Nano- and micro-plasmonics; towards scanning probe SPR microscopy and plasmonic sensors integrated to multi-well plate readers
纳米和微米等离子体激元;
  • 批准号:
    341972-2011
  • 财政年份:
    2015
  • 资助金额:
    $ 30万
  • 项目类别:
    Discovery Grants Program - Individual
{{ showInfoDetail.title }}

作者:{{ showInfoDetail.author }}

知道了