SHF:Small: EM-Aware Physical Design and Run-Time Optimization for sub-10nm 2D and 3D Integrated Circuits
SHF:Small: EM-Aware Physical Design and Run-Time Optimization for sub-10nm 2D and 3D Integrated Circuits
批准号:
1816361
负责人:
Sheldon Tan
金额:
$45.0万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2018
资助国家:
美国
项目状态:
已结题
起止时间:
2018-08-01 至 2022-07-31
中文摘要
电迁移 (EM) 已成为纳米级集成电路 (IC) 和新兴三维 (3D) 堆叠 IC 的主要设计约束和可靠性问题。 由于其重要性,最近在电磁建模和快速数值评估技术方面取得了许多进展。 然而,现有的 EM 感知物理设计和优化方法尚未充分利用这些先进的 EM 模型来减少和缓解过于保守的 VLSI 设计实践。新的EM模型可以自然地首次考虑布线拓扑和结构对互连线EM故障的影响以及EM老化过程的恢复效果,从而为物理设计阶段的EM优化提供了新的机会。该奖项将探索的新颖的 EM 优化技术将在持续积极的晶体管缩小和增加功率密度的情况下提高 IC 的可靠性。 该项目的研究将对纳米超大规模集成电路设计的电磁感知物理设计和优化的核心知识和技术做出重大贡献。该研究人员将寻求招募代表性不足的少数族裔学生,以进一步为美国科技劳动力的多样性做出贡献。该项目将为纳米领域的传统二维 (2D) 和新兴 3D 堆叠 IC 开发先进的电磁感知物理优化技术和运行时电磁缓解技术。首先,该研究将基于新提出的通用互连树的 EM 永生性检查规则,为主流 2D 和新兴 3D IC 的电力传输网络开发新的 EM 感知优化技术。新的优化算法还将考虑电磁引起的老化效应,使用更准确的电磁寿命估计方法进行目标寿命优化。其次,该研究将探索电磁老化过程的运行时恢复效应,以延长 3D 堆叠 IC 中信号和电源/接地 (P/G) 网络的电磁寿命。因此,新的优化方法将有助于延长 3D 堆叠 IC 的使用寿命。该奖项反映了 NSF 的法定使命,并通过使用基金会的智力价值和更广泛的影响审查标准进行评估,被认为值得支持。
英文摘要
Electro-Migration (EM) has emerged as a major design constraint and reliability issue for nano-meter-scale integrated circuits (ICs) and emerging three-dimensional (3D) stacked ICs. Due to its importance, many advances have been made recently in EM modeling and fast numerical assessment techniques. However, those advanced EM models have not been fully exploited by existing EM-aware physical design and optimization methods to reduce and mitigate the overly conservative VLSI design practices. The new EM models can naturally consider wire topology and structure impacts on the EM failures of interconnect wires and recovery effects of EM aging process for the first time, thus opening new opportunities for EM optimization at physical design stages. Novel EM optimization techniques to be explored in this award will improve IC reliability amid continued aggressive transistor scaling and increasing power density. The research in this project will contribute significantly to the core knowledge and technologies of EM-aware physical design and optimization for nano-meter VLSI designs. This investigator will seek to recruit underrepresented minority students to further contribute to the diversity in U.S. science and technology workforce.This project will develop advanced EM-aware physical optimization techniques and run-time EM mitigation techniques for traditional two-dimensional (2D) and emerging 3D stacked ICs in the nano-meter regime. First, the research will develop new EM-aware optimization techniques for power delivery networks of mainstream 2D and emerging 3D ICs based on the newly proposed EM immortality-check rules for general interconnect trees. The new optimization algorithms will also consider the EM-induced aging effects for targeted lifetime optimization using more accurate EM lifetime estimation methods. Second, the research will explore the run-time recovery effects of the EM aging process to extend the EM lifetime of the signal and power/ground (P/G) networks in 3D stacked ICs. The new optimization methods will, thus, help extend the lifetime of the 3D stacked ICs.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.
期刊论文(24)
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DOI:
10.1016/j.vlsi.2020.10.001
发表时间:
2021-03
期刊:
Integr.
影响因子:
--
作者:
[Han Zhou;Liang Chen;S. Tan]
通讯作者:
Han Zhou;Liang Chen;S. Tan
DOI:
10.1016/j.vlsi.2019.09.012
发表时间:
2020
期刊:
Integr.
影响因子:
--
作者:
[Shaoyi Peng;E. Demircan;M. Shroff;S. Tan]
通讯作者:
Shaoyi Peng;E. Demircan;M. Shroff;S. Tan
Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy
通过片上传感器和制造后认证策略检测假冒 IC
DOI:
10.1016/j.vlsi.2018.05.002
发表时间:
2018
期刊:
Integration
影响因子:
1.9
作者:
[Kim, Taeyoung, Tan, Sheldon X.-D., Cook, Chase, Sun, Zeyu]
通讯作者:
Sun, Zeyu
Runtime Long-Term Reliability Management Using Stochastic Computing in Deep Neural Networks
在深度神经网络中使用随机计算的运行时长期可靠性管理
DOI:
--
发表时间:
2021
期刊:
Proc. Int. Symposium. on Quality Electronic Design (ISQED’21
影响因子:
--
作者:
[Liu, Y., Yu, S., Peng, S., Tan, S. X.-D.]
通讯作者:
Tan, S. X.-D.
DOI:
10.1109/asp-dac47756.2020.9045673
发表时间:
2020-01
期刊:
2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)
影响因子:
--
作者:
[Han Zhou;Shuyuan Yu;Zeyu Sun;S. Tan]
通讯作者:
Han Zhou;Shuyuan Yu;Zeyu Sun;S. Tan
共 23 条
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批准号:2305437
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负责人:Sheldon Tan
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SHF:Small: Data-Driven Thermal Monitoring and Run-Time Management for Manycore Processor and Chiplet Designs
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SHF:Small: Machine Learning Approach for Fast Electromigration Analysis and Full-Chip Assessment
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IRES Track I: Development of Global Scientists and Engineers by Collaborative Research on Reliability-Aware IC Design
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批准号:1854276
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项目类别:Standard Grant
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资助金额:$30.0万
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财政年份:2019
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负责人:Sheldon Tan
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依托单位:
SHF: Small: Physics-Based Electromigration Assessment and Validation For Reliability-Aware Design and Management
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批准号:1527324
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项目类别:Standard Grant
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资助金额:$45.0万
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财政年份:2015
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负责人:Sheldon Tan
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依托单位:
Thermal-Sensitive System-Level Reliability Analysis and Management for Multi-Core and 3D Microprocessors
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批准号:1255899
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项目类别:Continuing Grant
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资助金额:$18.0万
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财政年份:2013
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负责人:Sheldon Tan
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依托单位:
US-Singapore Planning Visit: Collaborative Research on Design and Verification of 60Ghz RF/MM Integrated Circuits
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批准号:1051797
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项目类别:Standard Grant
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资助金额:$1.47万
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财政年份:2011
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负责人:Sheldon Tan
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依托单位:
IRES: Development of Global Scientists and Engineers by Collaborative Research on Variation-Aware Nanometer IC Design
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批准号:1130402
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项目类别:Standard Grant
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资助金额:$15.0万
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财政年份:2011
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依托单位:
SHF: Small: Variational and Bound Performance Analysis of Nanometer Mixed-Signal/Analog Circuits
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批准号:1116882
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项目类别:Standard Grant
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资助金额:$27.5万
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财政年份:2011
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负责人:Sheldon Tan
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依托单位:
SHF:Small:GPU-Based Many-Core Parallel Simulation of Interconnect and High-Frequency Circuits
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批准号:1017090
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项目类别:Continuing Grant
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资助金额:$27.0万
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Parameterized Architecture-Level Thermal Modeling and Characterization for Multi-Core Microprocessor Design
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批准号:0902885
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资助金额:$25.95万
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依托单位:
U.S.- China Workshop on Advanced Simulation and Design Techniques
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批准号:0929699
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资助金额:$5.96万
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财政年份:2009
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依托单位:
IRES: Development of Global Scientists by Research Collaborations on Simulation and Optimization of Nanometer Integrated Systems
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资助金额:$14.99万
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依托单位:
CAREER: Career Development Plan: Behavioral Modeling, Simulation and Optimization for Mixed-Signal System on a Chip
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批准号:0448534
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项目类别:Continuing Grant
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资助金额:$0.0万
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财政年份:2005
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负责人:Sheldon Tan
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依托单位:
U.S.-China Planning Visit: Development of Computer-Aided Design (CAD) Tools for Physical Design and Verification for Low Power Nanometer VLSI Designs
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批准号:0451688
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资助金额:$1.09万
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财政年份:2005
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负责人:Sheldon Tan
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依托单位:
国内基金
海外基金
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