In situ and real-time investigations of organic semiconductor film growth

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This proposal is devoted to the in situ and real-time study of the kinetically controlled structural transitions and associated optical changes of molecular thin films during growth. By concentrating on real-time investigations, processes and effects influencing the growth, which would be missed in exclusively post-growth experiments, will be captured. The results would provide a basis for the development of theoretical models incorporating the inherent degrees of freedom of these materials, which lead to fundamentally new growth effects. In addition, a better understanding would promote the application of various molecular materials for which the question of the orientational order and its evolution during preparation is essential. This challenging project is based on the use of in situ and real-time techniques, namely X-ray scattering, difference reflectance spectroscopy (DRS), and spectroscopic ellipsometry. Raman and IR spectroscopy as well as AFM will be employed as complementary ex situ techniques. This project addresses the different aspects of the real-time evolution of crystalline order and tilt structure, the evolution of the surface morphology and implications for the optical properties of organic thin films.