In situ and real-time investigations of organic semiconductor film growth

有机半导体薄膜生长的原位实时研究

• 批准号: 99734980
• 负责人: Professor Dr. Frank Schreiber
• 金额: --
• 依托单位: Institut für Chemie
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2009
• 资助国家: 德国
• 起止时间: 2008-12-31 至 2012-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/99734980?language=en
• 关键词: situ; real; time; investigations; organic

This proposal is devoted to the in situ and real-time study of the kinetically controlled structural transitions and associated optical changes of molecular thin films during growth. By concentrating on real-time investigations, processes and effects influencing the growth, which would be missed in exclusively post-growth experiments, will be captured. The results would provide a basis for the development of theoretical models incorporating the inherent degrees of freedom of these materials, which lead to fundamentally new growth effects. In addition, a better understanding would promote the application of various molecular materials for which the question of the orientational order and its evolution during preparation is essential. This challenging project is based on the use of in situ and real-time techniques, namely X-ray scattering, difference reflectance spectroscopy (DRS), and spectroscopic ellipsometry. Raman and IR spectroscopy as well as AFM will be employed as complementary ex situ techniques. This project addresses the different aspects of the real-time evolution of crystalline order and tilt structure, the evolution of the surface morphology and implications for the optical properties of organic thin films.

该提案致力于对生长过程中分子薄膜的动力学控制结构转变和相关光学变化进行原位实时研究。通过专注于实时调查，将捕获影响生长的过程和影响，而这些在专门的生长后实验中可能会被遗漏。研究结果将为结合这些材料固有自由度的理论模型的开发提供基础，从而产生全新的生长效应。此外，更好的理解将促进各种分子材料的应用，其中取向顺序及其在制备过程中的演变问题至关重要。这个具有挑战性的项目基于原位和实时技术的使用，即 X 射线散射、差值反射光谱 (DRS) 和光谱椭圆光度术。拉曼光谱、红外光谱以及原子力显微镜将被用作补充的非原位技术。该项目解决了晶体有序和倾斜结构的实时演化、表面形态的演化以及对有机薄膜光学特性的影响的不同方面。

项目成果

Chain-length dependent growth dynamics of n-alkanes on silica investigated by energy-dispersive x-ray reflectivity in situ and in real-time.

• DOI: 10.1063/1.4719530
• 发表时间: 2012-05
• 期刊: The Journal of chemical physics
• 作者: C. Weber;C. Frank;S. Bommel;T. Rukat;W. Leitenberger;P. Schäfer;F. Schreiber;S. Kowarik

Real-time X-ray scattering studies on temperature dependence of perfluoropentacene thin film growth

全氟并五苯薄膜生长温度依赖性的实时 X 射线散射研究

• DOI: 10.1063/1.4816320
• 发表时间: 2013
• 期刊: Journal of Applied Physics
• 影响因子: 3.2
• 作者: C. Frank;J. Novak;A. Gerlach;G. Ligorio;K. Broch;A. Hinderhofer;A. Aufderheide;R. Banerjee;R. Nervo;F. Schreiber
• 通讯作者: F. Schreiber

Structure formation in perfluoropentacene:diindenoperylene blends and its impact on transient effects in the optical properties studied in real-time during growth.

• DOI: 10.1063/1.4827868
• 发表时间: 2013-11
• 期刊: The Journal of chemical physics
• 作者: K. Broch;A. Gerlach;C. Lorch;J. Dieterle;J. Novák;A. Hinderhofer;F. Schreiber

Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering

• DOI: 10.1103/physrevb.90.045410
• 发表时间: 2014-07
• 期刊: Physical Review B
• 影响因子: 3.7
• 作者: C. Frank;J. Novák;R. Banerjee;A. Gerlach;F. Schreiber;A. Vorobiev;S. Kowarik

Molecular reorganization in organic field-effect transistors and its effect on two-dimensional charge transport pathways.

• DOI: 10.1021/nn304733w
• 发表时间: 2013-02
• 期刊: ACS nano
• 影响因子: 17.1
• 作者: F. Liscio;C. Albonetti;K. Broch;Arian Shehu;S. Quiroga;Laura Ferlauto;C. Frank;S. Kowarik;Roberto Nervo;A. Gerlach;S. Milita;F. Schreiber;F. Biscarini