In situ and real-time investigations of organic semiconductor film growth

该方案致力于原位和实时研究分子薄膜在生长过程中的动力学控制的结构转变和相关的光学变化。通过集中于实时调查，影响生长的过程和效果将被捕捉到，而这些过程和影响将被完全在生长后实验中遗漏。这些结果将为开发包含这些材料固有自由度的理论模型提供基础，这些自由度将导致根本上的新的生长效应。此外，更好的理解将促进各种分子材料的应用，对这些材料来说，取向顺序及其在制备过程中的演化问题是必不可少的。这一具有挑战性的项目基于现场和实时技术的使用，即X射线散射、差分反射光谱(DRS)和光谱椭偏测量。拉曼光谱和红外光谱以及原子力显微镜将被用作互补的非原位技术。该项目涉及晶体有序和倾斜结构的实时演变、表面形貌的演变以及对有机薄膜光学性质的影响的不同方面。

This proposal is devoted to the in situ and real-time study of the kinetically controlled structural transitions and associated optical changes of molecular thin films during growth. By concentrating on real-time investigations, processes and effects influencing the growth, which would be missed in exclusively post-growth experiments, will be captured. The results would provide a basis for the development of theoretical models incorporating the inherent degrees of freedom of these materials, which lead to fundamentally new growth effects. In addition, a better understanding would promote the application of various molecular materials for which the question of the orientational order and its evolution during preparation is essential. This challenging project is based on the use of in situ and real-time techniques, namely X-ray scattering, difference reflectance spectroscopy (DRS), and spectroscopic ellipsometry. Raman and IR spectroscopy as well as AFM will be employed as complementary ex situ techniques. This project addresses the different aspects of the real-time evolution of crystalline order and tilt structure, the evolution of the surface morphology and implications for the optical properties of organic thin films.