EAGER: Characterization and Modeling of Nanoscaled Semiconductor Devices
EAGER: Characterization and Modeling of Nanoscaled Semiconductor Devices
批准号:
0946439
负责人:
Marvin White
金额:
$15.0万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2009
资助国家:
美国
项目状态:
已结题
起止时间:
2009-09-01 至 2011-08-31
中文摘要
摘要我们提出了一个EAGER项目,以应用一种新的方法来研究高k纳米级半导体MOSFET器件中的低场载流子迁移率。高介电介质中具有库仑散射中心的器件。该概念将允许在具有双端结构的纳米级器件中评估低场载流子输运,而不是制造三端器件结构。我们将使用两种异质绝缘体器件结构:(1)非易失性,电荷陷阱?(2)在高k介电介质中具有固定电荷的金属栅高k纳米mos晶体管。智力上的优点包括研究和教育的整合,通过简单的双端电导和电容测量来探索高k纳米器件的低场载流子传输,从而减轻了制造带有欧姆触点的三端器件的需要。我们将通过改变电荷的符号、大小和位置来表征实验高-高k器件中库仑电荷对载流子输运的影响。在完成的器件结构上,两端测量将与三端测量进行比较。实验和理论研究涉及器件物理、化学、材料科学和纳米尺度的建模。我们计划的更广泛方面将促进纳米电子劳动力的多样性,提供智力技术转让,研究和教育的整合,以及促进与工业经济部门的伙伴关系。我们已经制定了优秀的教育和推广计划,以增加纳米电子学,特别是半导体器件的多样性。这是维持美国在全球经济中的领导地位的重要领域。我们的研究为少数民族学生的推广和与行业的合作提供了一个很好的工具。我们研究的变革性在于一种用简单的双端结构模拟低场输运的新方法,这种结构可以很容易地在实验室中制造,而不需要大量的光刻设备。该概念适用于广泛的新兴纳米器件中载流子输运的研究,并将有助于该技术的快速创新进步
英文摘要
EAGER: Characterization and Modeling of Nanoscaled Semiconductor DevicesMarvin H. WhiteLehigh UniversityAbstractWe propose a EAGER program to apply a new approach to study low-field carrier mobilityin high-K, nanoscaled, semiconductor MOSFET devices ? devices with Coulombscattering centers in the high-K dielectrics. This concept will permit the evaluation of lowfieldcarrier transport in nanoscaled devices with a two-terminal structure rather than thefabrication of a three-terminal device structure. We will use two hetero-insulator devicestructures: (1) a nonvolatile, ?charge-trap?, nanoscaled MANOS semiconductor memorydevice with programmable charge storage and (2) a metal gate, high-K, nanoscaledMOS transistor with fixed charge in the high-K dielectric.The intellectual merit involves the integration of research and education to explore lowfield,carrier transport in high-K nanoscaled devices with a simple two-terminalconductance and capacitance measurement, thereby, alleviating the need to fabricatethree-terminal devices complete with ohmic contacts. We will characterize the influenceof Coulomb charge in experimental high high-K devices on carrier transport by varyingthe sign, magnitude and position of the charge. Two terminal measurements will becompared with three-terminal measurements on completed device structures. Theexperimental and theoretical studies involve device physics, chemistry, materialsscience and modeling at the nanoscale.The broader aspects in our program will advance diversity in the nanoelectronicsworkforce and provide intellectual technology transfer, integration of research andeducation, and promotion of partnerships with the industrial sector of the economy. Wehave developed excellent educational and outreach programs to increase diversity withopportunities in nanoelectronics, especially semiconductor devices ? an important areato maintain US leadership in a global economy. Our research provides an excellentvehicle for minority student outreach and partnerships with industry.The transformative nature of our research lies in a new approach to model low fieldtransport with simple two-terminal structures, which can be easily fabricated in thelaboratory without extensive photolithographic equipment. The concept is applicable tothe study of carrier transport in a broad range of emerging nanoscaled devices and willaid rapid and innovative advances in the technology
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Carrier Transport in Scaled Charge-Trap NVSM and CMOS Devices
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批准号:1201656
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资助金额:$32.98万
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财政年份:2012
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负责人:Marvin White
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依托单位:
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依托单位:
Advanced Nanoscaled Nonvolatile Semiconductor Memory (NVSM) Devices
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批准号:0801491
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资助金额:$0.0万
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An Integrated BiChip for Ion-Channel Studies
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批准号:0524049
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资助金额:$0.0万
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依托单位:
Charge Transport and Storage in Nanoscaled Nonvolatile Semiconductor Memory (NVSM) SONOS Devices
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批准号:0429032
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项目类别:Continuing grant
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资助金额:$0.0万
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财政年份:2004
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依托单位:
Carrier Transport in Advanced Silicon Carbide (SiC) Devices
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批准号:0207093
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资助金额:$24.0万
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Integrated Sensing: An Integrated Biosensor System for Cellular Studies
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Collaborative Research: Advanced High Dielectric Constant Gate Materials for CMOS Devices
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批准号:0223106
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资助金额:$27.0万
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Acquisition of an Electron Beam Nanolithography System
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批准号:0116423
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资助金额:$36.0万
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财政年份:2001
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负责人:Marvin White
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依托单位:
Nanoscaled Nonvolatile Semiconductor Memory (NVSM) SONOS Devices
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批准号:0114809
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资助金额:$30.0万
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依托单位:
Electronic DNA Sequencing with Ion Channel Research
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批准号:0086178
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项目类别:Standard Grant
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资助金额:$6.5万
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财政年份:2000
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负责人:Marvin White
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依托单位:
Physical Electronics of Ultra-Thin Dielectrics for Nanoscaled Nonvolatile Semiconductor Memory Devices
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批准号:9810923
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资助金额:$30.0万
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财政年份:1998
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Physical Electronics of Nonvolatile Multi-dielectric Nanostructures
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批准号:9412466
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资助金额:$33.4万
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财政年份:1994
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依托单位:
Physical Electronics of Multi-Dielectric Microstructures
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批准号:9023607
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项目类别:Continuing grant
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资助金额:$29.54万
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财政年份:1991
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负责人:Marvin White
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依托单位:
Physical Electronics of Mult-Dielectric Microstructures
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批准号:8818159
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项目类别:Standard Grant
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资助金额:$5.86万
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财政年份:1989
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负责人:Marvin White
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依托单位:
Charge Transport and Storage in Multi-Insulator Microstructures
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批准号:8506575
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项目类别:Continuing Grant
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资助金额:$28.88万
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财政年份:1985
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负责人:Marvin White
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依托单位:
Charge Transport and Storage in Mnos Memory Devices
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批准号:8203096
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项目类别:Continuing Grant
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资助金额:$16.5万
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财政年份:1982
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依托单位:
Automated Data Acquisition and Fabrication Equipment For Custom Microelectronics Device Research
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资助金额:$6.2万
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依托单位:
海外基金