In situ and real-time investigations of organic semiconductor film growth

本课题致力于分子薄膜生长过程中动力学控制的结构转变和相关光学变化的原位实时研究。通过集中进行实时调查，将捕捉到影响生长的过程和影响，而这些过程和影响只在生长后的实验中会被遗漏。这些结果将为发展包含这些材料固有自由度的理论模型提供基础，从而从根本上导致新的生长效应。此外，更好地了解取向秩序及其在制备过程中的演变问题将促进各种分子材料的应用。这个具有挑战性的项目是基于使用现场和实时技术，即x射线散射、差反射光谱（DRS）和光谱椭偏仪。拉曼光谱和红外光谱以及原子力显微镜将被用作补充的非原位技术。该项目涉及晶体顺序和倾斜结构的实时演变的不同方面，表面形态的演变以及对有机薄膜光学性质的影响。

This proposal is devoted to the in situ and real-time study of the kinetically controlled structural transitions and associated optical changes of molecular thin films during growth. By concentrating on real-time investigations, processes and effects influencing the growth, which would be missed in exclusively post-growth experiments, will be captured. The results would provide a basis for the development of theoretical models incorporating the inherent degrees of freedom of these materials, which lead to fundamentally new growth effects. In addition, a better understanding would promote the application of various molecular materials for which the question of the orientational order and its evolution during preparation is essential. This challenging project is based on the use of in situ and real-time techniques, namely X-ray scattering, difference reflectance spectroscopy (DRS), and spectroscopic ellipsometry. Raman and IR spectroscopy as well as AFM will be employed as complementary ex situ techniques. This project addresses the different aspects of the real-time evolution of crystalline order and tilt structure, the evolution of the surface morphology and implications for the optical properties of organic thin films.