X-Ray Phase Contrast Imaging Concepts and Systems

在过去的两年中，发现了一种形式的x射线白光干涉，并在此基础上，一种类型的x射线相衬成像装置，能够检测x射线的折射弯曲在亚纳弧度分辨率与宽带x射线源。我们发明了一种无需机械扫描即可检索相位信息的方法，以及一种自适应图像重建算法，以适应理想实验室设置之外的未来应用环境。这些方法在实现临床应用中的有益X射线相衬成像的道路上被进一步开发和优化。 上述工作的基础是200 nm周期的硬X射线衍射光栅。它们是在我们实验室与几个校外小组合作的另一个项目中完成的。

In the past two years discovered a form of x-ray white-light interferometry, and based on it a type of x-ray phase contrast imaging device capable of detecting the refractive bending of x-rays at sub-nanoradian resolution with broadband x-ray sources. We invented a way to retrieve the phase information without the need for mechanical scanning, and an adaptive image reconstruction algorithm to suit future application environments outside the ideal laboratory setting. These methods are further developed and optimized, on the path towards realizing the benefit x-ray phase-contrast imaging in clinical applications. A foundation of the above work is hard x-ray diffraction gratings of 200 nm periods. They are accomplished in another project of our laboratory in collaboration with several extramural groups.