Physics and Applications of Doping in Molecular Semiconductor Films
分子半导体薄膜中掺杂的物理和应用
基本信息
- 批准号:1005892
- 负责人:
- 金额:$ 36.98万
- 依托单位:
- 依托单位国家:美国
- 项目类别:Continuing Grant
- 财政年份:2010
- 资助国家:美国
- 起止时间:2010-07-01 至 2015-06-30
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
Technical: This project addresses fundamental issues in organic semiconductor materials; dopant selection, impact of doping on the electrical behavior of molecular films and interfaces, and features of doping particularly relevant to device performance. The approach encompasses: a search for strongly reducing agents of the organometallic 'sandwich' type. Cr- or Fe-based organometallics such as Fe(C5H5)(C6Me6) are predicted to have an ionization energy 200-300 meV smaller than the strongest molecular n-dopant investigated to date. Similarly, strongly oxidizing agents in the transition metal dithiolene family and transition metal oxides will be studied, along with the stability of the dopant vs. diffusion or contamination as a function of operating conditions (temperature, environment). In the second area of research the relative benefits of interface doping vs. interface engineering (electrode modification) in terms of carrier injection will be addressed. The impact of doping on the mobility of carriers in bulk films, and whether the benefit of doping-induced filling deep traps outweighs additional scattering and trapping caused by these impurities will be assessed. Scanning tunneling microscopy/ spectroscopy (STM/STS) will be used to investigate dopants and related potentials with molecular resolution. The third general theme of the research, application of doping to devices, will involve investigation of power conversion efficiencies in organic photovoltaic cells doped on both sides, i.e., p-doped donor and n-doped acceptor layers, to improve carrier extraction, contacts and electron-hole pair separation. The use of transition metal oxide molecules (as dopants) and films (as high work function electrodes) for charge generation layers and key structures of high efficiency, multi-layer stacked devices will also be studied. These activities will involve a multi-technique approach to fully characterize the electronic, chemical and charge transport properties of these materials (ultra-violet, X-ray and inverse photoemission spectroscopy, STM/STS, current- and capacitance-voltage measurements). Collaborations with chemists, device physicists and theoreticians are established, and will be an integral feature of the research approach.Non-technical: The project addresses basic research issues in electronics/photonics materials science with high technological relevance, and will provide important opportunities for student training. The project is expected to improve our understanding and facilitate the generalization of chemical doping in organic devices, with potentially important industrial applications. It will expose students (graduate and undergraduate) to a range of fundamental materials physics and electronic structure problems, as well as to practical device issues, to a variety of experimental techniques, and to different research environments through collaborations in chemistry and theory of electronic structure. Through his participation in outreach programs at Princeton University, short courses given to industry, and involvement in scientific societies, the PI has been and will remain extremely active in the teaching and dissemination of knowledge in the field of organic electronics.
技术:该项目解决有机半导体材料的基本问题;掺杂剂的选择,掺杂对分子膜和界面电行为的影响,以及与器件性能特别相关的掺杂特性。该方法包括:寻找有机金属“三明治”型的强还原剂。预计基于Cr或Fe的有机金属,如Fe(C5H5)(C6Me6)的电离能比迄今为止研究的最强分子n掺杂剂小200-300 meV。同样,过渡金属二硫烯家族和过渡金属氧化物中的强氧化剂将被研究,以及掺杂剂对扩散或污染的稳定性作为操作条件(温度,环境)的函数。在第二个研究领域中,将讨论界面掺杂与界面工程(电极修饰)在载流子注入方面的相对优势。将评估掺杂对体膜中载流子迁移率的影响,以及掺杂诱导填充深阱的好处是否超过这些杂质引起的额外散射和捕获。扫描隧道显微镜/光谱(STM/STS)将用于研究掺杂剂和相关电位的分子分辨率。本研究的第三个主题是掺杂在器件中的应用,将涉及研究有机光伏电池在两侧掺杂的功率转换效率,即p掺杂给体层和n掺杂受体层,以改善载流子提取,接触和电子-空穴对分离。将过渡金属氧化物分子(作为掺杂剂)和薄膜(作为高功函数电极)用于电荷生成层和高效多层堆叠器件的关键结构也将进行研究。这些活动将涉及多种技术方法,以充分表征这些材料的电子、化学和电荷输运特性(紫外线、x射线和逆光电发射光谱、STM/STS、电流和电容电压测量)。与化学家,设备物理学家和理论家的合作已经建立,并将成为研究方法的一个整体特征。非技术:本项目涉及电子/光子材料科学的基础研究问题,具有很高的技术相关性,并将为学生的培训提供重要的机会。该项目有望提高我们的理解,促进有机器件中化学掺杂的推广,具有潜在的重要工业应用。它将使学生(研究生和本科生)接触到一系列基础材料物理和电子结构问题,以及实际设备问题,各种实验技术,以及通过化学和电子结构理论的合作,了解不同的研究环境。通过参与普林斯顿大学的外展项目,为工业界提供短期课程,以及参与科学社团,PI一直并将继续在有机电子学领域的教学和知识传播方面非常活跃。
项目成果
期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
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Antoine Kahn其他文献
Observation of filled states at the Fermi-level in alkali-metal intercalated organic films: dependence on substrate work function
碱金属插层有机薄膜费米能级填充态的观察:对基底功函数的依赖性
- DOI:
10.1016/j.elspec.2005.01.016 - 发表时间:
2005 - 期刊:
- 影响因子:0
- 作者:
Norbert Koch;Frank Jäckel;J. Ghijsen;M. Rojas;M. Grioni;Jürgen P. Rabe;Robert L. Johnson;Antoine Kahn;J. Pireaux - 通讯作者:
J. Pireaux
Relative permittivity and Hubbard <em>U</em> of pentacene extracted from scanning tunneling microscopy studies of <em>p</em>-doped films
- DOI:
10.1016/j.cplett.2010.06.085 - 发表时间:
2010-08-10 - 期刊:
- 影响因子:
- 作者:
Sieu D. Ha;Yabing Qi;Antoine Kahn - 通讯作者:
Antoine Kahn
One-dimensional organic nanostructures: A novel approach based on the selective adsorption of organic molecules on silicon nanowires
- DOI:
10.1016/j.susc.2008.04.023 - 发表时间:
2008-07-01 - 期刊:
- 影响因子:
- 作者:
Eric Salomon;Antoine Kahn - 通讯作者:
Antoine Kahn
Antoine Kahn的其他文献
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{{ truncateString('Antoine Kahn', 18)}}的其他基金
Gap State Compensation in Organic Semiconductors: The Ultra-Low Doping Regime
有机半导体中的能隙态补偿:超低掺杂机制
- 批准号:
1506097 - 财政年份:2015
- 资助金额:
$ 36.98万 - 项目类别:
Standard Grant
Status and perspectives for the hybrid organic-inorganic perovskite-based and -inspired systems as future energy materials
有机-无机杂化钙钛矿基和启发系统作为未来能源材料的现状和前景
- 批准号:
1448886 - 财政年份:2014
- 资助金额:
$ 36.98万 - 项目类别:
Standard Grant
Fundamentals and Applications of Organic Interfaces
有机界面的基础和应用
- 批准号:
0705920 - 财政年份:2007
- 资助金额:
$ 36.98万 - 项目类别:
Continuing Grant
Energetics and Electronical Doping at Interfaces of Molecular Films
分子膜界面的能量学和电子掺杂
- 批准号:
0408589 - 财政年份:2004
- 资助金额:
$ 36.98万 - 项目类别:
Continuing Grant
Organic Molecular Thin Films: Interface Electronic Properties
有机分子薄膜:界面电子特性
- 批准号:
0097133 - 财政年份:2001
- 资助金额:
$ 36.98万 - 项目类别:
Continuing Grant
Support of the Tenth International Conference on Solid Films and Surfaces, Princeton, NJ, July 9-13, 2000
第十届国际固体薄膜和表面会议的支持,新泽西州普林斯顿,2000 年 7 月 9-13 日
- 批准号:
0070418 - 财政年份:2000
- 资助金额:
$ 36.98万 - 项目类别:
Standard Grant
III - V Nitride Surfaces and Interfaces: Atomic and Electronic Properties
III - V 氮化物表面和界面:原子和电子特性
- 批准号:
9618771 - 财政年份:1997
- 资助金额:
$ 36.98万 - 项目类别:
Continuing Grant
Atomic and Electronic Properties of Surfaces and Interfaces of Wide Band Gap Compound Semiconductors
宽带隙化合物半导体表面和界面的原子和电子性质
- 批准号:
9321826 - 财政年份:1994
- 资助金额:
$ 36.98万 - 项目类别:
Continuing Grant
Atomic and Electronic Properties of Compound Semiconductor Surfaces and Their Interfaces with Metals
化合物半导体表面及其与金属界面的原子和电子性质
- 批准号:
9018521 - 财政年份:1991
- 资助金额:
$ 36.98万 - 项目类别:
Continuing Grant
Acquisition of an Ultra-High Vacuum System to House a Scanning Tunneling Microscope
购买超高真空系统来容纳扫描隧道显微镜
- 批准号:
8906530 - 财政年份:1989
- 资助金额:
$ 36.98万 - 项目类别:
Standard Grant
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