课题基金 / 基金详情

SaTC: Collaborative: Exploiting Spintronics for Security, Trust and Authentication

SaTC: Collaborative: Exploiting Spintronics for Security, Trust and Authentication
SaTC:协作:利用自旋电子学实现安全、信任和身份验证
批准号:
1722557
负责人:
Swaroop Ghosh
金额:
$22.9万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2016
资助国家:
美国
项目状态:
已结题
起止时间:
2016-09-26 至 2019-08-31

项目摘要

项目成果

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中文摘要
翻译
基于互补金属氧化物半导体(CMOS)的安全基元通常遭受面积/功率开销、对环境波动的敏感性以及由硅衬底提供的有限随机性和熵。自旋电子电路可以补充现有的基于CMOS的安全和信任基础设施。本项目旨在探索如何揭示磁性纳米线的安全特性,并将其捕获到详细的电路模型中。本项目研究了磁性纳米线中存在的噪声源和随机性,并设计了新的技术来获取熵。研究人员将非线性磁动力学的电路和模型结合起来,以实现硬件安全原语和引擎,并在恶劣条件和攻击场景下通过实验验证模型和设计思想。该项目开发的技术将提高未来电路和系统的安全性和能效。
英文摘要
The Complementary Metal Oxide Semiconductor (CMOS) based security primitives typically suffer from area/power overhead, sensitivity to environmental fluctuations and limited randomness and entropy offered by Silicon substrate. Spintronic circuits can complement the existing CMOS based security and trust infrastructures. This project explores ways to uncover the security specific properties of the magnetic nanowire and capture them in detailed circuit model.This project investigates noise sources and randomness present in the magnetic nanowire, and engineers new techniques to harvest the entropy. The investigators combine the circuits and models of non-linear magnetic dynamics to realize hardware security primitives and engines and experimentally validating the models and design ideas under harsh conditions and attack scenarios. The techniques developed in this project will improve the security and energy-efficiency of future circuits and systems.
期刊论文(10)
专著(0)
科研奖励(0)
会议论文
Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM
用于 STTRAM 保持力和磁容差测试的新型磁力老化
DOI: 10.1109/tvlsi.2018.2820508
发表时间: 2018
期刊: IEEE Transactions on Very Large Scale Integration (VLSI
影响因子: --
作者: [Khan, Mohammad Nasim, Iyengar, Anirudh S., Ghosh, Swaroop]
通讯作者: Ghosh, Swaroop
Test challenges and solutions for emerging non-volatile memories
新兴非易失性存储器的测试挑战和解决方案
DOI: 10.1109/vts.2018.8368632
发表时间: 2018
期刊: VLSI Test Symposium (VTS
影响因子: --
作者: [Khan, Mohammad Nasim, Ghosh, Swaroop]
通讯作者: Ghosh, Swaroop
Test of Supply Noise for Emerging Non-Volatile Memory
新兴非易失性存储器的电源噪声测试
DOI: 10.1109/test.2018.8624896
发表时间: 2018
期刊: IEEE International Test Conference (ITC
影响因子: --
作者: [Khan, Mohammad Nasim, Ghosh, Swaroop]
通讯作者: Ghosh, Swaroop
DOI: 10.1166/jolpe.2018.1560
发表时间: 2018
期刊: Journal of Low Power Electronics
影响因子: --
作者: [Iyengar, Anirudh S., Ghosh, Swaroop, Rathi, Nitin]
通讯作者: Rathi, Nitin
10
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    SaTC: EDU: A Curriculum for Quantum Security and Trust
    NSF Convergence Accelerator - Track C: SQAI: Scalable Quantum Artificial Intelligence for Discovery
    海外基金