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GaN-Based Transistors with Trigate Architecture

GaN-Based Transistors with Trigate Architecture
具有三栅极架构的 GaN 晶体管
批准号:
243486436
负责人:
Professor Dr. Oliver Ambacher
金额:
$0.0万
依托单位国家:
德国
项目类别:
Research Grants
财政年份:
2013
资助国家:
德国
项目状态:
已结题
起止时间:
2012-12-31 至 2016-12-31

项目摘要

项目成果

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中文摘要
翻译
GaN hemt(高电子迁移率晶体管)近年来已成为一种流行的器件,特别是在功率开关和射频功率放大器中的应用。功率开关和射频放大器是现代信息通信技术的关键部件。GaN晶体管在这些器件中的应用提供了许多优势,因此GaN晶体管,特别是GaN hemt的发展得到了积极的推动。迄今为止实现的大多数GaN HEMT都是在零外加栅极电压下具有导电通道的dhemt(耗尽HEMT)。这严重限制了它们的潜在应用领域,因为经常需要为零栅极电压关闭的ehemt(增强HEMT)。目前的项目专注于一个新的和有前途的晶体管架构,即最近在硅电子中流行的三角概念。在本项目中,将这一概念应用于GaN hemt,并对GaN三重ehemt进行深入研究。这三个在晶体管理论和GaN技术方面具有公认专业知识的项目合作伙伴将进行GaN三极管结构的研究,特别强调用于功率开关和射频放大器的GaN三极管ehemt。他们将密切合作并-详细研究GaN三极管ehemt的物理和操作,-为功率开关和射频应用精心设计此类晶体管,-开发和建立GaN三极管hemt的完整工艺流程,-制造GaN三极管ehemt并对这些晶体管进行彻底的电气表征,-评估GaN三极管概念的潜力。将进行广泛的器件模拟,以深入了解GaN三极管hemt的物理和操作。所得结果为设计适合功率开关和射频应用的三极管提供了基础。从工艺的角度来看,主要的挑战是通过蚀刻深沟槽来制造用于三重hemt的AlGaN/GaN体,从而避免在体侧壁形成缺陷,以及在侧壁上沉积金属和介电体。该项目的主要目标是(i)实现与传统GaN顶栅hemt成功竞争的GaN三极管ehemt, (ii)显著增强GaN三极管hemt的知识状态,以及(iii)对这些晶体管的潜力进行有充分根据的批判性评估。
英文摘要
GaN HEMTs (High Electron Mobility Transistor) have become popular devices recently, in particular for application in power switches and RF (Radio Frequency) power amplifiers. Power switches and RF amplifiers are key components for modern information and communication technology. The application of GaN transistors in these components offers many advantages and therefore the development of GaN transistors, in particular GaN HEMTs, is pushed forward aggressively. Most GaN HEMTs realized so far are dHEMTs (depletion HEMT) having a conducting channel at zero applied gate voltage. This seriously limits their potential application areas since frequently eHEMTs (enhancement HEMT) are needed that for zero gate voltage are switched off. The present project is focused on a new and promising transistor architecture, namely the trigate concept that became popular in silicon electronics quite recently. In the project, this concept will be adopted to GaN HEMTs and in-depth research on GaN trigate eHEMTs will be carried out. The three project partners with recognized expertise in transistor theory and GaN technology will conduct research on GaN trigate structures with special emphasis on GaN trigate eHEMTs for power switches and RF amplifiers. They will closely collaborate and - investigate the physics and operation of GaN trigate eHEMTs in detail,- elaborate suitable designs of such transistors for power switches and RF applications,- develop and establish a complete process flow for GaN trigate HEMTs, - fabricate GaN trigate eHEMTs and perform a thorough electrical characterization of these transistors,- assess the potential of the trigate concept for GaN.Extensive device simulations will be performed to get insights in the physics and operation of GaN trigate HEMTs. The obtained results serve as basis for elaborating suitable designs of trigate eHEMTs for power switches and RF applications. From the processing point of view, major challenges are the fabrication of the AlGaN/GaN bodies for trigate HEMTs by etching deep trenches, thereby avoiding the formation of defects at the body sidewalls, and the deposition of metals and dielectrics on the sidewalls. Key targets of the project are (i) the realization of GaN trigate eHEMTs that successfully compete with conventional GaN top-gate HEMTs, (ii) a significant enhancement of the state of knowledge on GaN trigate HEMTs, and (iii) a well-founded and critical assessment of the potential of these transistors.
期刊论文(7)
专著(0)
科研奖励(0)
会议论文
Performance and parasitic analysis of sub-micron scaled tri-gate AlGaN/GaN HEMT design
亚微米级三栅 AlGaN/GaN HEMT 设计的性能和寄生分析
DOI: 10.1109/eumic.2015.7345077
发表时间: 2015
期刊: 2015 10th European Microwave Integrated Circuits Conference (EuMIC)
影响因子: --
作者: [E. Ture, P. Brückner, F. V. Raay, M. Alsharef, R. Granzner, F. Schwierz, R. Quay, O. Ambacher]
通讯作者: O. Ambacher
DOI: 10.1109/jeds.2015.2503701
发表时间: 2016
期刊: IEEE Journal of the Electron Devices Society
影响因子: 2.3
作者: [E. Ture;P. Bruckner;B. Godejohann;R. Aidam;M. Alsharef;R. Granzner;F. Schwierz;R. Quay;O. Ambacher]
通讯作者: E. Ture;P. Bruckner;B. Godejohann;R. Aidam;M. Alsharef;R. Granzner;F. Schwierz;R. Quay;O. Ambacher
Design of GaN tri-gate HEMTs
GaN三栅HEMT的设计
DOI: 10.1109/asdam.2014.6998657
发表时间: 2014
期刊: The Tenth International Conference on Advanced Semiconductor Devices and Microsystems
影响因子: --
作者: [M. Alsharef, R. Granzner, E. Ture, R. Quay, J. Racko, J. Breza, F. Schwierz]
通讯作者: F. Schwierz
DOI: 10.1109/ted.2016.2606701
发表时间: 2016-09
期刊: IEEE Transactions on Electron Devices
影响因子: 3.1
作者: [M. Alsharef;M. Christiansen;R. Granzner;E. Ture;R. Quay;O. Ambacher;F. Schwierz]
通讯作者: M. Alsharef;M. Christiansen;R. Granzner;E. Ture;R. Quay;O. Ambacher;F. Schwierz
共 7 条
    Investigations of GaN-based vertical field effect transistors for applications in high-power electronics
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    High-Q-Power-GaN - Development of transistors for high-power electronics on low-defect free-standing gallium nitride substrates
    AlScN - a novel barrier material for GaN based rf transistors
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