Study on electron-beam-induced excitation on Si surfaces
硅表面电子束诱导激发研究
基本信息
- 批准号:04650259
- 负责人:
- 金额:$ 1.28万
- 依托单位:
- 依托单位国家:日本
- 项目类别:Grant-in-Aid for General Scientific Research (C)
- 财政年份:1992
- 资助国家:日本
- 起止时间:1992 至 1993
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
This research aims at investigating atomic-scale crystal growth techniques for IV group semiconductors which are to be necessary for creating the next-generation semiconductor devices with ultra-fine structures. Final goal of this research is to clear the reaction mechanisms of electron-beam-induced excitation of a Si_2H_6/Si (001) system and apply this electron-beam irradiation method to atomic-scale crystal growth. The head investigator has already indicated the possibility of atomic-scale crystal growth with this system from his early research.In the first stage of this research, the reaction mechanisms of thermal excitation were investigated, which provide fundamental processes necessary for exploring of a new crystal growth technique. As a result, relations between adsorption reaction, pyrolysis reaction of adsorbates, surface migration reaction of adsorbates, and epitaxial growth reaction have been clearly understood in the wide range of growth temperature and Si_2H_6 pressure. T … More hese results should give important and fundamental knowledge to understand the surface reaction mechanisms of IV group semiconductors and to expand crystal growth technologies.On the basis of this research, a sub-monolayr-by-sub-monolayr digital epitaxial growth technique of Si has been proposed, and multilayr Si films have been successfully grown with this technique. This technique is named Sub-Atomic-Layr Epitaxy. The results has been published in international conferences of IUMRS (Tokyo, 1993) and so on.Through the above research, relations between desorption mechanism of hydrogen, surface adatom migration mechanisms, and epitaxial growth mechanisms have been well understood. These mechanisms suggest the direction of coming research on atomic-scale digital epitaxy.In the final stage of this research, electron-induced desorption of hydrogen from Si_2H_6・adsorbed Si surfaces was tried on the basis of the above knowledge. The hydrogen desorption is a key process for atomic-scale digital epitaxy. To accomplish the experiment, a new system has been successfully constructed where both of electron-beam and Si_2H_6 gas are able to be simultaneously introduced on the surface. With this system, the promotion of Si growth and hydrogen desorption by the electron-beam irradiation has been confirmed. This research indicates a clue to apply the surface excitation method by electron-beam irradiation to next epitaxial growth technologies. Less
本研究旨在探讨IV族半导体的原子尺度晶体生长技术,这对于制造具有超细结构的下一代半导体器件是必要的。本研究的最终目的是弄清Si_2H_6/Si(001)体系电子束激发的反应机理,并将这种电子束辐照方法应用于原子级晶体生长。本研究的第一阶段主要研究了热激发的反应机理,为探索新的晶体生长技术提供了必要的基础过程。结果表明,在较宽的生长温度和Si_2H_6压力范围内,吸附反应、吸附物的热解反应、吸附物的表面迁移反应和外延生长反应之间的关系得到了清楚的认识。不 ...更多信息 在此基础上,提出了一种亚单层-亚单层数字化硅外延生长技术,并成功地生长了多层硅薄膜。这种技术被称为亚原子层外延。研究结果已在IUMRS(Tokyo,1993)等国际会议上发表。通过上述研究,对氢的脱附机制、表面吸附原子迁移机制和外延生长机制之间的关系有了较好的认识。在本研究的最后阶段,在上述认识的基础上,我们尝试了电子诱导氢从Si_2 H_6·吸附表面上的脱附。氢脱附是实现原子尺度数字外延的关键工艺。为了完成实验,我们成功地建立了一个新的系统,其中电子束和Si_2H_6气体能够同时引入到表面上。利用该系统,证实了电子束辐照对Si生长和氢脱附的促进作用。本研究为电子束辐照表面激发法在下一代外延生长技术中的应用提供了线索。少
项目成果
期刊论文数量(16)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
Masahiro Ishida: "Sub-atomic-layer epitaxy of Si" Proceedings of the 45th symposium on semiconductons and Integrated Circuits Technology. 112-117 (1993)
Masahiro Ishida:“Si 的亚原子层外延”第 45 届半导体和集成电路技术研讨会论文集。
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- 影响因子:0
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- 通讯作者:
Y.Suda, M.Ishida, M.Yamashita, and H.Ikeda: "Sub-atomic-layr epitaxy of Si using Si_2H_6" Appl.Surf.Sci.(in press). (1994)
Y.Suda、M.Ishida、M.Yamashita 和 H.Ikeda:“使用 Si_2H_6 进行 Si 的亚原子层外延”Appl.Surf.Sci.(出版中)。
- DOI:
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- 影响因子:0
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Yoshiyuki Suda: "Sub-atomic-layer epitaxy of Si using Si_2H_6" Proceedings IUMRS-ICAM-93. (in press). (1994)
Yoshiyuki Suda:“使用 Si_2H_6 进行 Si 的亚原子层外延”论文集 IUMRS-ICAM-93。
- DOI:
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- 影响因子:0
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Y.Suda,M Shirahama,and M.Ishida: "Sub-atomic-layer epitaxy of Si using Si_2H_6" Proceedings 3rd IUMRS Int.Conf. on Advanced Materials,ed.by S.Somiya,M.Doyama,M.Hasegawa,and S.Yamada (Elsevier,Amsterdam,1994). (in press). (1994)
Y.Suda、M Shirahama 和 M.Ishida:“使用 Si_2H_6 进行 Si 的亚原子层外延”论文集第 3 届 IUMRS Int.Conf。
- DOI:
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- 影响因子:0
- 作者:
- 通讯作者:
Y.Suda, M.Shirahama, and M.Ishida: "Sub-atomic-layr epitaxy of Si using Si_2H_6" Proceedings 3rd IUMRS Int.Conf.on Advanced Materials.ed.by S.Somiya, M.Doyama, M.Hasegawa, and S.Yamada (Elsevier, Amsterdam). (in press). (1994)
Y.Suda、M.Shirahama 和 M.Ishida:“使用 Si_2H_6 进行 Si 的亚原子层外延”论文集第三届 IUMRS Int.Conf.on Advanced Materials.ed.by S.Somiya、M.Doyama、M.Hasekawa
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{{ truncateString('SUDA Yoshiyuki', 18)}}的其他基金
Technology of Formation of Ge Virtual Substrates by Growth of Ge Flat Films Directly on Si Using Sputter Epitaxy Method
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25630123 - 财政年份:2013
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$ 1.28万 - 项目类别:
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25630110 - 财政年份:2013
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21360164 - 财政年份:2009
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19360156 - 财政年份:2007
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Selective growth of metallic/semiconducting single-walled carbon nanotubes by precise supply control of chemically active species
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19740339 - 财政年份:2007
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14350179 - 财政年份:2002
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08650369 - 财政年份:1996
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