Sub-Atomic-Layr Epitaxy of Si/Ge Semiconductors

Si/Ge 半导体的亚原子层外延

基本信息

  • 批准号:
    08650369
  • 负责人:
  • 金额:
    $ 1.22万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
  • 财政年份:
    1996
  • 资助国家:
    日本
  • 起止时间:
    1996 至 1997
  • 项目状态:
    已结题

项目摘要

Atomic Layr Epitaxy (ALE) is an epitaxial film growth technique with which a film is grown layr-by-layr using an one-monolayr saturation adsorption reaction ; a self -limiting function. Hydride molecules are attractive for their being free of impurity species. However, since their saturation coverages are less than one monolayr, it is generally difficcult to realize ALE using the hydride molecules. In 1993, Suda (head investigator) et al. proposed that a sub-atomic-layr epitaxy (SALE) method with which a film is epitaxially grown submonolayr by submonolayr repeating an exposure of hydride molecules and an adatom migration process induced by surface thermal excitation. The adatom migration process is a key process which has not been focused on for ALE and with it, submonolayr-by submonolayr epitaxy is relized. In this research, the relationship between the SALE prowth conditions and growth characteristics including growth modes, growth rates, and growth morphologies has been obtained us … More ing a Si_<>H_6-on-Si (001) system. On the basis of the results, a SALE growth model has been proposed Through these work, fundamental growth mechanisms and a growth control method for SALE has been obtained. The results suggest that SALE growth with a growth unit of saturation coverage if the saturation coverage of a hydride molecule is in the rangeof 0 to 2 monolayr. In this resesarch, a method for Si/Ge ALE has been also investigated. Through this work, thermally cracking method was first applied and it has been found that thermally cracked Si_<>H_6 species saturate at one monolayr on both Si (001) and Ge (001). In the case of Si ALE on GE (001), Si/Ge interface is abrupt. The results imply that thermally cracked GeH_4 is also promising for Ge ALE.With the SALE and thermal cracking ALE using hydride molecules proposed by the head investigator, atomically controlled epitaxy technologies for IV-group semiconductors are expected to be widely promoted and the methods will give a great contribution to the progress of Si/Ge quantum well devices. Less
原子层外延(ALE)是一种利用单层饱和吸附反应逐层生长薄膜的外延膜生长技术;一个自限函数。氢化物分子因不含杂质而具有吸引力。然而,由于氢化物分子的饱和覆盖范围小于单层,通常难以利用氢化物分子实现ALE。1993年,Suda(首席研究员)等人提出了一种亚原子层外延(SALE)方法,该方法通过亚单层重复暴露氢化物分子和表面热激发诱导的吸附原子迁移过程,在亚单层下外延生长薄膜。结合原子迁移过程是ALE的一个尚未被关注的关键过程,利用它可以实现亚单层的亚单层外延。本研究在Si_<>H_6-on-Si(001)体系中得到了SALE生长条件与生长方式、生长速率和生长形态的关系。在此基础上,提出了一个销售增长模型。通过这些工作,获得了销售的基本增长机制和增长控制方法。结果表明,当氢化物分子的饱和覆盖范围在0 ~ 2个单层时,SALE生长以饱和覆盖为生长单位。在本研究中,还研究了一种Si/Ge ALE的方法。通过这项工作,首次应用了热裂解方法,并发现热裂解的Si_<>H_6物质在Si(001)和Ge(001)上均在单分子层上饱和。对于GE(001)上的Si ALE, Si/ GE界面是突变的。结果表明,热裂解的GeH_4也很有希望用于Ge ALE。随着首席研究员提出的利用氢化物分子的SALE和热裂解ALE, iv族半导体的原子控制外延技术有望得到广泛推广,该方法将为Si/Ge量子阱器件的发展做出巨大贡献。少

项目成果

期刊论文数量(17)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
Y.Suda: "Migration-Assisted Si Sub-Atomic-Layr Epitaxy from Si_2H_6" J.Vac. Sci. Technol.A15. 2643-2468 (1997)
Y.Suda:“Si_2H_6 的迁移辅助硅亚原子层外延”J.Vac。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
Y.Suda, Y.Misato, and D.Shiratori: "Si Atomic-Layr Epitaxy Using Thermally-Cracked Si_2H_6" J.Crystal Growth. (submitted).
Y.Suda、Y.Misato 和 D.Shiratori:“使用热裂化 Si_2H_6 进行硅原子层外延”J.晶体生长。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
M.Ishida, M.Yamashita, Y.Nagata, and Y.Suda: "Growth Temperature Window and Self-Limiting Process in Sub-Atomic-Layer Epitaxy" Jpn.J.Appl.Phys.35. 4011-4015 (1996)
M.Ishida、M.Yamashita、Y.Nagata 和 Y.Suda:“亚原子层外延中的生长温度窗口和自限过程”Jpn.J.Appl.Phys.35。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
Y.Suda, M.Ishida, and M.Yamashita: "Ar^+-Laser Assisted Sub-Atomic-Layer Epitxy of Si" J.Crystal Growth. 169. 672-680 (1996)
Y.Suda、M.Ishida 和 M.Yamashita:“Ar^ -激光辅助 Si 的亚原子层外延”J.晶体生长。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
Y.Suda,M.Ishida and M.Yamashita: "Ar^+-laser assisted sub-atomic-layer epitaxy of Si" J.Crystal Growth. 169. 672-680 (1996)
Y.Suda、M.Ishida 和 M.Yamashita:“Ar^-激光辅助 Si 的亚原子层外延”J.Crystal Growth。
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  • 期刊:
  • 影响因子:
    0
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SUDA Yoshiyuki其他文献

SUDA Yoshiyuki的其他文献

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{{ truncateString('SUDA Yoshiyuki', 18)}}的其他基金

Technology of Formation of Ge Virtual Substrates by Growth of Ge Flat Films Directly on Si Using Sputter Epitaxy Method
溅射外延法在Si上直接生长Ge平膜形成Ge虚拟衬底技术
  • 批准号:
    25630123
  • 财政年份:
    2013
  • 资助金额:
    $ 1.22万
  • 项目类别:
    Grant-in-Aid for Challenging Exploratory Research
Observation of electromagnetic induction phenomena of a nanometer-scale coil
纳米级线圈电磁感应现象的观察
  • 批准号:
    25630110
  • 财政年份:
    2013
  • 资助金额:
    $ 1.22万
  • 项目类别:
    Grant-in-Aid for Challenging Exploratory Research
Technology of Formation of Ge Flat Film Directly on Si by P SurfactantEffect and Sputter Epitaxy Method
磷表面活性剂溅射外延法在硅上直接形成Ge平膜技术
  • 批准号:
    23656210
  • 财政年份:
    2011
  • 资助金额:
    $ 1.22万
  • 项目类别:
    Grant-in-Aid for Challenging Exploratory Research
Use of carbon nanocoil as catalyst support for development of high-performance fuel cell
使用碳纳米线圈作为催化剂载体开发高性能燃料电池
  • 批准号:
    22760208
  • 财政年份:
    2010
  • 资助金额:
    $ 1.22万
  • 项目类别:
    Grant-in-Aid for Young Scientists (B)
High-Density New Two-Terminal Resistive Nonvolatile Memory Using SiC and Its Integration Technology
采用SiC的高密度新型两端电阻式非易失性存储器及其集成技术
  • 批准号:
    21360164
  • 财政年份:
    2009
  • 资助金额:
    $ 1.22万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
High-Density New Two-Terminal Resistive Nonvolatile MemoryUsing Silicon Carbide
采用碳化硅的高密度新型两端电阻式非易失性存储器
  • 批准号:
    19360156
  • 财政年份:
    2007
  • 资助金额:
    $ 1.22万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
Selective growth of metallic/semiconducting single-walled carbon nanotubes by precise supply control of chemically active species
通过化学活性物质的精确供应控制选择性生长金属/半导体单壁碳纳米管
  • 批准号:
    19740339
  • 财政年份:
    2007
  • 资助金额:
    $ 1.22万
  • 项目类别:
    Grant-in-Aid for Young Scientists (B)
Si/SiGe Multiple-Barrier Resonant Tunneling Diode and Its Integrated Technology
Si/SiGe多势垒谐振隧道二极管及其集成技术
  • 批准号:
    14350179
  • 财政年份:
    2002
  • 资助金额:
    $ 1.22万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
Si/SiGe Multiple-Quantum-well Resonant Tunneling Device
Si/SiGe多量子阱谐振隧道器件
  • 批准号:
    12450141
  • 财政年份:
    2000
  • 资助金额:
    $ 1.22万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
Study on electron-beam-induced excitation on Si surfaces
硅表面电子束诱导激发研究
  • 批准号:
    04650259
  • 财政年份:
    1992
  • 资助金额:
    $ 1.22万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (C)

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利用磁光-物质相互作用开发集成在硅上的基于稀土氧化物的光学放大器和激光器
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硅中的基本注入、外延和缺陷研究,以支持超浅结的形成
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