SHF:Small: Collaborative Research: Exploring 3-Dimensional Integration Strategies of STTRAM
SHF:Small: Collaborative Research: Exploring 3-Dimensional Integration Strategies of STTRAM
批准号:
1718474
负责人:
Swaroop Ghosh
金额:
$22.5万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2017
资助国家:
美国
项目状态:
已结题
起止时间:
2017-08-01 至 2022-07-31
中文摘要
从大数据分析、物联网(IoT)、可穿戴电子产品、智能手机、辅助设备、网络安全到天气跟踪系统等几个关键领域的最新进展推动了高密度存储器的发展。由于能源消耗增加、可扩展性限制和带宽有限,目前可用的传统存储技术在满足这些需求方面面临着严峻的挑战。该提案的目标是通过实现自旋扭矩转移RAM器件(STTRAM)与适当的选择二极管(SD)的3D集成来开发新型存储器件。这些类型的存储设备将具有大规模可扩展性,高能效和快速,这将为将它们集成到现有存储架构中提供巨大的机会,以实现各种未来应用。该项目将通过将研究成果纳入PI的学术课程来整合教育。将通过合作寻求工业反馈。未被充分代表的群体将通过宾夕法尼亚州立大学(PSU)和辛辛那提大学(UC)的几个外展项目参与科学和工程,如PSU的暑期研究机会项目(SROP)和UC的新兴族裔工程师项目(E3),该项目为来自市中心学校的经济困难背景的高中生提供参加实习和实验室体验活动的机会。本科生将通过两所大学的本科生研究经验(REU)项目参与研究。结果的传播将通过在高影响力的科学期刊上发表文章、会议报告和YouTube讲座视频来完成。该项目的智力优势在于了解了STTRAM器件与SD的集成兼容性,并基于集成的STTRAM和SD开发了高度可扩展的3D交叉棒存储技术阵列。这些目标将通过执行以下具体目标来实现:(i) STTRAM-SD阵列的建模和仿真,(ii)弹性分析和优化研究,以最大限度地减少设备级变量对性能指标的影响,(iii)针对高性能计算和物联网的STTRAM-SD架构优化,(iv)基于能带工程和掺杂工程过渡金属氧化物和电极堆的新型SD器件的设计、制造、测试和建模,(v)小尺寸STTRAM-SD阵列的设计和制造,电气测试和建模,以基准模拟和实验结果。预计该项目的成功完成将使人们对STTRAM与SD的兼容性有一个基本的了解,并为开发高密度存储器提供一个平台技术,这将对商业化和推进未来的应用产生革命性的影响。
英文摘要
The development of high-density memory is fueled by recent advancements in several critical areas ranging from big data analytics, Internet-of-Things (IoT), wearable electronics, smart phones, assistive devices, cybersecurity to weather tracking systems. Currently available conventional memory technologies face serious challenges in addressing these needs due to increased energy consumption, scalability limitations, and limited bandwidth. The objective of this proposal is to develop novel memory devices by enabling 3D integration of spin-torque transfer RAM devices (STTRAM) with appropriate selector diodes (SD). These type of memory devices will be massively scalable, energy-efficient, and fast which will open tremendous opportunities to integrate them in existing memory architectures to enable various futuristic applications. The project will integrate education by incorporating research outcomes in PI's academic courses. Industrial feedback will be sought via collaborations. Under-represented groups will be involved in science and engineering through several outreach programs at Penn State University (PSU) and University of Cincinnati (UC) such as Summer Research Opportunities Program (SROP) at PSU, and Emerging Ethnic Engineers (E3) program at UC which provides opportunities to the high-school students from the inner-city schools with economically challenged background to participate in internships and lab-experience activities. Undergraduate students will be involved in research via Research Experiences for Undergraduates (REU) program at both the universities. Dissemination of results will be accomplished by publications in high-impact scientific journals, conference presentations, and YouTube lecture videos. The intellectual merit of the project is in understanding the integration compatibility of STTRAM devices with SD and developing highly scalable 3D crossbar arrays of memory technologies based on integrated STTRAM and SD. The objectives will be achieved by executing the following specific aims: (i) modeling and simulation of STTRAM-SD arrays, (ii) resilience analysis and optimization studies to minimize the impact of device-level variabilities on performance metrics, (iii) optimization of STTRAM-SD architectures for high-performance computing and IoT, (iv) designing, fabrication, testing, and modeling of novel SD devices based on energy band-engineered and doping-engineered transition metal oxide and electrode stacks, (v) designing and fabrication of small-size STTRAM-SD arrays, electrical testing and modeling to benchmark simulations and experimental results. It is anticipated that the successful completion of this project will lead to a fundamental understanding of the compatibility of STTRAM with SD and provide a platform-technology to develop high-density memories which will have transformative impact on commercializing and advancing the futuristic applications.
期刊论文(36)
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Power side channel attack analysis and detection
电源侧通道攻击分析与检测
DOI:
--
发表时间:
2020
期刊:
international conference on computer-aided design
影响因子:
--
作者:
[Gattu, Navyata and]
通讯作者:
Gattu, Navyata and
Test challenges and solutions for emerging non-volatile memories
新兴非易失性存储器的测试挑战和解决方案
DOI:
10.1109/vts.2018.8368632
发表时间:
2018
期刊:
VLSI Test Symposium (VTS
影响因子:
--
作者:
[Khan, Mohammad Nasim, Ghosh, Swaroop]
通讯作者:
Ghosh, Swaroop
DOI:
10.1109/tcad.2020.2984407
发表时间:
2020-12
期刊:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
影响因子:
2.9
作者:
[Asmit De;Aditya Basu;Swaroop Ghosh;T. Jaeger]
通讯作者:
Asmit De;Aditya Basu;Swaroop Ghosh;T. Jaeger
DOI:
10.1109/tvlsi.2022.3170542
发表时间:
2020-11
期刊:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
影响因子:
2.8
作者:
[Sina Sayyah Ensan;Swaroop Ghosh;Seyedhamidreza Motaman;Derek Weast]
通讯作者:
Sina Sayyah Ensan;Swaroop Ghosh;Seyedhamidreza Motaman;Derek Weast
Dynamic Computing in Memory (DCIM) in Resistive Crossbar Arrays
电阻交叉阵列中的内存动态计算 (DCIM)
DOI:
10.1109/iccd.2018.00036
发表时间:
2018
期刊:
IEEE 36th International Conference on Computer Design (ICCD
影响因子:
--
作者:
[Motaman, Seyedhamidreza, Ghosh, Swaroop]
通讯作者:
Ghosh, Swaroop
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